%0 Journal Article %1 journals/tvlsi/SawadaYTNN15 %A Sawada, Takuya %A Yoshikawa, Kumpei %A Takata, Hidehiro %A Nii, Koji %A Nagata, Makoto %D 2015 %J IEEE Trans. Very Large Scale Integr. Syst. %K dblp %N 10 %P 2347-2351 %T An Extended Direct Power Injection Method for In-Place Susceptibility Characterization of VLSI Circuits Against Electromagnetic Interference. %U http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi23.html#SawadaYTNN15 %V 23

@article{journals/tvlsi/SawadaYTNN15, added-at = {2020-03-11T00:00:00.000+0100}, author = {Sawada, Takuya and Yoshikawa, Kumpei and Takata, Hidehiro and Nii, Koji and Nagata, Makoto}, biburl = {https://www.bibsonomy.org/bibtex/22b0b081ba362a634ff4f4c308e0acdb3/dblp}, ee = {https://doi.org/10.1109/TVLSI.2014.2361208}, interhash = {bf0954c1d8bfe8d7cca2563a15e629f9}, intrahash = {2b0b081ba362a634ff4f4c308e0acdb3}, journal = {IEEE Trans. Very Large Scale Integr. Syst.}, keywords = {dblp}, number = 10, pages = {2347-2351}, timestamp = {2020-03-12T11:44:25.000+0100}, title = {An Extended Direct Power Injection Method for In-Place Susceptibility Characterization of VLSI Circuits Against Electromagnetic Interference.}, url = {http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi23.html#SawadaYTNN15}, volume = 23, year = 2015 }