Article,

Voltage tuneable terahertz emission from a ballistic nanometer InGaAs/InAlAs transistor

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J. Appl. Phys., 97 (6): 064307 (March 2005)
DOI: 10.1063/1.1861140

Abstract

Terahertz emission from InGaAs/InAlAs lattice-matched high electron mobility transistors was observed. The emission appears in a threshold-like manner when the applied drain-to-source voltage U(DS) is larger than a threshold value U(TH). The spectrum of the emitted signal consists of two maxima. The spectral position of the lower-frequency maximum (around 1 THz) is sensitive to U(DS) and U(GS), while that of the higher frequency one (around 5 THz) is not. The lower-frequency maximum is interpreted as resulting from the Dyakonov-Shur instability of the gated two-dimensional electron fluid, while the higher frequency is supposed to result from current-driven plasma instability in the ungated part of the channel. The experimental results are confirmed by and discussed within Monte Carlo calculations of the high-frequency current noise spectra. (C) 2005 American Institute of Physics.

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