%0 Journal Article %1 journals/tcad/ChengRTRK98 %A Cheng, Yi-Kan %A Raha, Prasun %A Teng, Chin-Chi %A Rosenbaum, Elyse %A Kang, Sung-Mo %D 1998 %J IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. %K dblp %N 8 %P 668-681 %T ILLIADS-T: an electrothermal timing simulator for temperature-sensitive reliability diagnosis of CMOS VLSI chips. %U http://dblp.uni-trier.de/db/journals/tcad/tcad17.html#ChengRTRK98 %V 17

@article{journals/tcad/ChengRTRK98, added-at = {2020-09-24T00:00:00.000+0200}, author = {Cheng, Yi-Kan and Raha, Prasun and Teng, Chin-Chi and Rosenbaum, Elyse and Kang, Sung-Mo}, biburl = {https://www.bibsonomy.org/bibtex/2affdc4fc50e403e870ef7961fe0e7d30/dblp}, ee = {https://doi.org/10.1109/43.712099}, interhash = {c0544cbee5405fcef97ebfe412cb15dd}, intrahash = {affdc4fc50e403e870ef7961fe0e7d30}, journal = {IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.}, keywords = {dblp}, number = 8, pages = {668-681}, timestamp = {2020-09-25T11:46:56.000+0200}, title = {ILLIADS-T: an electrothermal timing simulator for temperature-sensitive reliability diagnosis of CMOS VLSI chips.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad17.html#ChengRTRK98}, volume = 17, year = 1998 }