%0 Conference Paper %1 conf/iscas/AcevedoR02 %A Acevedo, G. O. D. %A Ramírez-Angulo, Jaime %B ISCAS (1) %D 2002 %I IEEE %K dblp %P 149-152 %T Built-in self-test scheme for on-chip diagnosis, compliant with the IEEE 1149.4 mixed-signal test bus standard. %U http://dblp.uni-trier.de/db/conf/iscas/iscas2002-1.html#AcevedoR02 %@ 0-7803-7448-7

@inproceedings{conf/iscas/AcevedoR02, added-at = {2016-05-20T00:00:00.000+0200}, author = {Acevedo, G. O. D. and Ramírez-Angulo, Jaime}, biburl = {https://www.bibsonomy.org/bibtex/2b198f69f62354270d0eb36194372f40b/dblp}, booktitle = {ISCAS (1)}, crossref = {conf/iscas/2002}, ee = {http://dx.doi.org/10.1109/ISCAS.2002.1009799}, interhash = {c439f8aec089d378f39fe726ac4800a6}, intrahash = {b198f69f62354270d0eb36194372f40b}, isbn = {0-7803-7448-7}, keywords = {dblp}, pages = {149-152}, publisher = {IEEE}, timestamp = {2016-05-21T12:03:45.000+0200}, title = {Built-in self-test scheme for on-chip diagnosis, compliant with the IEEE 1149.4 mixed-signal test bus standard.}, url = {http://dblp.uni-trier.de/db/conf/iscas/iscas2002-1.html#AcevedoR02}, year = 2002 }