%0 Journal Article %1 journals/tvlsi/SabryBAV97 %A Sabry, Mohammed Nabil %A Bontemps, A. %A Aubert, V. %A Vahrmann, R. %D 1997 %J IEEE Trans. Very Large Scale Integr. Syst. %K dblp %N 3 %P 283-289 %T Realistic and efficient simulation of electro-thermal effects in VLSI circuits. %U http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi5.html#SabryBAV97 %V 5

@article{journals/tvlsi/SabryBAV97, added-at = {2024-06-10T00:00:00.000+0200}, author = {Sabry, Mohammed Nabil and Bontemps, A. and Aubert, V. and Vahrmann, R.}, biburl = {https://www.bibsonomy.org/bibtex/2beb3beca973b858e0ef68289c2fc6399/dblp}, ee = {https://www.wikidata.org/entity/Q56960022}, interhash = {c5e792dc4d2cc52406d6475c277684b9}, intrahash = {beb3beca973b858e0ef68289c2fc6399}, journal = {IEEE Trans. Very Large Scale Integr. Syst.}, keywords = {dblp}, number = 3, pages = {283-289}, timestamp = {2024-06-17T07:06:10.000+0200}, title = {Realistic and efficient simulation of electro-thermal effects in VLSI circuits.}, url = {http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi5.html#SabryBAV97}, volume = 5, year = 1997 }