%0 Conference Paper %1 conf/icst/BasuC17 %A Basu, Tiyash %A Chattopadhyay, Sudipta %B ICST Workshops %D 2017 %I IEEE Computer Society %K dblp %P 51-60 %T Testing Cache Side-Channel Leakage. %U http://dblp.uni-trier.de/db/conf/icst/icstw2017.html#BasuC17 %@ 978-1-5090-6676-6

@inproceedings{conf/icst/BasuC17, added-at = {2018-11-02T00:00:00.000+0100}, author = {Basu, Tiyash and Chattopadhyay, Sudipta}, biburl = {https://www.bibsonomy.org/bibtex/29b57c42b4142addb7cc0fb2c618f5e67/dblp}, booktitle = {ICST Workshops}, crossref = {conf/icst/2017w}, ee = {https://doi.org/10.1109/ICSTW.2017.16}, interhash = {c758f1d1ea2aab2ad138af30c17a18bb}, intrahash = {9b57c42b4142addb7cc0fb2c618f5e67}, isbn = {978-1-5090-6676-6}, keywords = {dblp}, pages = {51-60}, publisher = {IEEE Computer Society}, timestamp = {2019-10-17T18:25:48.000+0200}, title = {Testing Cache Side-Channel Leakage.}, url = {http://dblp.uni-trier.de/db/conf/icst/icstw2017.html#BasuC17}, year = 2017 }