%0 Conference Paper %1 conf/ats/LinCR15 %A Lin, Xijiang %A Cheng, Wu-Tung %A Rajski, Janusz %B ATS %D 2015 %I IEEE Computer Society %K dblp %P 97-102 %T On Improving Transition Test Set Quality to Detect CMOS Transistor Stuck-Open Faults. %U http://dblp.uni-trier.de/db/conf/ats/ats2015.html#LinCR15 %@ 978-1-4673-9739-1

@inproceedings{conf/ats/LinCR15, added-at = {2023-03-24T00:00:00.000+0100}, author = {Lin, Xijiang and Cheng, Wu-Tung and Rajski, Janusz}, biburl = {https://www.bibsonomy.org/bibtex/2c83e15c70a1bffd6646aaa9e96bed7dc/dblp}, booktitle = {ATS}, crossref = {conf/ats/2015}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2015.24}, interhash = {c76b7f3ebada49ac1c87834caf703871}, intrahash = {c83e15c70a1bffd6646aaa9e96bed7dc}, isbn = {978-1-4673-9739-1}, keywords = {dblp}, pages = {97-102}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:36:42.000+0200}, title = {On Improving Transition Test Set Quality to Detect CMOS Transistor Stuck-Open Faults.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2015.html#LinCR15}, year = 2015 }