%0 Journal Article %1 journals/mr/JiaoFW14 %A Jiao, Jiajia %A Fu, Yuzhuo %A Wen, Shi-Jie %D 2014 %J Microelectron. Reliab. %K dblp %N 11 %P 2629-2640 %T Accelerated assessment of fine-grain AVF in NoC using a Multi-Cell Upsets considered fault injection. %U http://dblp.uni-trier.de/db/journals/mr/mr54.html#JiaoFW14 %V 54

@article{journals/mr/JiaoFW14, added-at = {2020-02-22T00:00:00.000+0100}, author = {Jiao, Jiajia and Fu, Yuzhuo and Wen, Shi-Jie}, biburl = {https://www.bibsonomy.org/bibtex/2db443ddd5be2de128e8d6cc038373626/dblp}, ee = {https://doi.org/10.1016/j.microrel.2014.06.008}, interhash = {c87f65f278269a46196049b0332c2af9}, intrahash = {db443ddd5be2de128e8d6cc038373626}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 11, pages = {2629-2640}, timestamp = {2020-02-25T13:27:24.000+0100}, title = {Accelerated assessment of fine-grain AVF in NoC using a Multi-Cell Upsets considered fault injection.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr54.html#JiaoFW14}, volume = 54, year = 2014 }