Пожалуйста, войдите в систему, чтобы принять участие в дискуссии (добавить собственные рецензию, или комментарий)
Цитировать эту публикацию
%0 Conference Paper
%1 conf/vlsid/LeBS07
%A Le, Kim T.
%A Baik, Dong Hyun
%A Saluja, Kewal K.
%B VLSI Design
%D 2007
%I IEEE Computer Society
%K dblp
%P 769-774
%T Test Time Reduction to Test for Path-Delay Faults using Enhanced Random-Access Scan.
%U http://dblp.uni-trier.de/db/conf/vlsid/vlsid2007.html#LeBS07
%@ 0-7695-2762-0
@inproceedings{conf/vlsid/LeBS07,
added-at = {2023-03-24T00:00:00.000+0100},
author = {Le, Kim T. and Baik, Dong Hyun and Saluja, Kewal K.},
biburl = {https://www.bibsonomy.org/bibtex/2827251d809901dbf053045e8c802b7b3/dblp},
booktitle = {VLSI Design},
crossref = {conf/vlsid/2007},
ee = {https://doi.ieeecomputersociety.org/10.1109/VLSID.2007.156},
interhash = {ca361f860bc30c91d986ffd0854fcab7},
intrahash = {827251d809901dbf053045e8c802b7b3},
isbn = {0-7695-2762-0},
keywords = {dblp},
pages = {769-774},
publisher = {IEEE Computer Society},
timestamp = {2024-04-10T04:18:09.000+0200},
title = {Test Time Reduction to Test for Path-Delay Faults using Enhanced Random-Access Scan.},
url = {http://dblp.uni-trier.de/db/conf/vlsid/vlsid2007.html#LeBS07},
year = 2007
}