%0 Conference Paper %1 conf/irps/ChenCMHLTLH18 %A Chen, I. K. %A Chen, S. C. %A Mukhopadhyay, S. %A Huang, D. S. %A Lee, J. H. %A Tsai, Y. S. %A Lu, Ryan %A He, Jun %B IRPS %D 2018 %I IEEE %K dblp %P 4 %T The physical mechanism investigation of off-state drain bias TDDB and its implication in advance HK/MG FinFETs. %U http://dblp.uni-trier.de/db/conf/irps/irps2018.html#ChenCMHLTLH18 %@ 978-1-5386-5479-8

@inproceedings{conf/irps/ChenCMHLTLH18, added-at = {2019-01-22T00:00:00.000+0100}, author = {Chen, I. K. and Chen, S. C. and Mukhopadhyay, S. and Huang, D. S. and Lee, J. H. and Tsai, Y. S. and Lu, Ryan and He, Jun}, biburl = {https://www.bibsonomy.org/bibtex/2bfa6558ef7c9b87854463844018664a1/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2018}, ee = {https://doi.org/10.1109/IRPS.2018.8353575}, interhash = {ca55d7ee1efb115e2157b277faf0d20c}, intrahash = {bfa6558ef7c9b87854463844018664a1}, isbn = {978-1-5386-5479-8}, keywords = {dblp}, pages = 4, publisher = {IEEE}, timestamp = {2019-10-17T14:45:36.000+0200}, title = {The physical mechanism investigation of off-state drain bias TDDB and its implication in advance HK/MG FinFETs.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2018.html#ChenCMHLTLH18}, year = 2018 }