%0 Conference Paper %1 conf/itc/DobbelaereVMMCE16 %A Dobbelaere, Wim %A Vanhooren, Ronny %A Man, Willy De %A Matthijs, Koen %A Coyette, Anthony %A Esen, Baris %A Gielen, Georges G. E. %B ITC %D 2016 %I IEEE %K dblp %P 1-9 %T Analog fault coverage improvement using final-test dynamic part average testing. %U http://dblp.uni-trier.de/db/conf/itc/itc2016.html#DobbelaereVMMCE16 %@ 978-1-4673-8773-6

@inproceedings{conf/itc/DobbelaereVMMCE16, added-at = {2018-11-02T00:00:00.000+0100}, author = {Dobbelaere, Wim and Vanhooren, Ronny and Man, Willy De and Matthijs, Koen and Coyette, Anthony and Esen, Baris and Gielen, Georges G. E.}, biburl = {https://www.bibsonomy.org/bibtex/21eb1bc7a4e9af6b8635d03448f3ece0c/dblp}, booktitle = {ITC}, crossref = {conf/itc/2016}, ee = {https://doi.org/10.1109/TEST.2016.7805829}, interhash = {cc7fd10538336d37374480cdb33bef32}, intrahash = {1eb1bc7a4e9af6b8635d03448f3ece0c}, isbn = {978-1-4673-8773-6}, keywords = {dblp}, pages = {1-9}, publisher = {IEEE}, timestamp = {2018-11-03T13:57:50.000+0100}, title = {Analog fault coverage improvement using final-test dynamic part average testing.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2016.html#DobbelaereVMMCE16}, year = 2016 }