%0 Journal Article %1 journals/mr/SunFXWZZCLL14 %A Sun, Yabin %A Fu, Jun %A Xu, Jun %A Wang, Yudong %A Zhou, Wei %A Zhang, Wei %A Cui, Jie %A Li, Gaoqing %A Liu, Zhihong %D 2014 %J Microelectron. Reliab. %K %N 12 %P 2728-2734 %T Impact of bias conditions on performance degradation in SiGe HBTs irradiated by 10 MeV Br ion. %U http://dblp.uni-trier.de/db/journals/mr/mr54.html#SunFXWZZCLL14 %V 54

@article{journals/mr/SunFXWZZCLL14, added-at = {2023-12-13T09:25:21.000+0100}, author = {Sun, Yabin and Fu, Jun and Xu, Jun and Wang, Yudong and Zhou, Wei and Zhang, Wei and Cui, Jie and Li, Gaoqing and Liu, Zhihong}, biburl = {https://www.bibsonomy.org/bibtex/2b1b92f6ad5142b4ebca2ccb2ab5837b8/admin}, ee = {https://doi.org/10.1016/j.microrel.2014.08.010}, interhash = {ce1d6632a4f0fd1f120b22fa7df41aa5}, intrahash = {b1b92f6ad5142b4ebca2ccb2ab5837b8}, journal = {Microelectron. Reliab.}, keywords = {}, number = 12, pages = {2728-2734}, timestamp = {2023-12-13T09:25:21.000+0100}, title = {Impact of bias conditions on performance degradation in SiGe HBTs irradiated by 10 MeV Br ion.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr54.html#SunFXWZZCLL14}, volume = 54, year = 2014 }