%0 Conference Paper %1 conf/eurodac/KunzmannB94 %A Kunzmann, Arno %A Böhland, Frank %B EDAC-ETC-EUROASIC %D 1994 %E Werner, Robert %I IEEE Computer Society %K %P 524-528 %T Gate-Delay Fault Test with Conventional Scan-Design. %U http://dblp.uni-trier.de/db/conf/eurodac/eurodac1994.html#KunzmannB94 %@ 0-8186-5410-4

@inproceedings{conf/eurodac/KunzmannB94, added-at = {2023-12-13T09:29:53.000+0100}, author = {Kunzmann, Arno and Böhland, Frank}, biburl = {https://www.bibsonomy.org/bibtex/2dfc8f9287246f076c79ad444bd840847/admin}, booktitle = {EDAC-ETC-EUROASIC}, crossref = {conf/eurodac/1994edac}, editor = {Werner, Robert}, ee = {https://doi.org/10.1109/EDTC.1994.326825}, interhash = {ced28e5bf05bb10ae43c46d6ca562550}, intrahash = {dfc8f9287246f076c79ad444bd840847}, isbn = {0-8186-5410-4}, keywords = {}, pages = {524-528}, publisher = {IEEE Computer Society}, timestamp = {2023-12-13T09:29:53.000+0100}, title = {Gate-Delay Fault Test with Conventional Scan-Design.}, url = {http://dblp.uni-trier.de/db/conf/eurodac/eurodac1994.html#KunzmannB94}, year = 1994 }