%0 Journal Article %1 journals/mr/ChenFHBL16 %A Chen, W. %A Franke, Jörg %A Herold, Christian %A Bhojani, Riteshkumar %A Lutz, Josef %D 2016 %J Microelectron. Reliab. %K %P 464-468 %T Internal processes in power semiconductors at virtual junction temperature measurement. %U http://dblp.uni-trier.de/db/journals/mr/mr64.html#ChenFHBL16 %V 64

@article{journals/mr/ChenFHBL16, added-at = {2023-12-13T09:44:42.000+0100}, author = {Chen, W. and Franke, Jörg and Herold, Christian and Bhojani, Riteshkumar and Lutz, Josef}, biburl = {https://www.bibsonomy.org/bibtex/2db8a4a8501e35212582ba8ceaa6664a9/admin}, ee = {https://doi.org/10.1016/j.microrel.2016.07.125}, interhash = {d143ed1aac3d60dce567314bb5e9d092}, intrahash = {db8a4a8501e35212582ba8ceaa6664a9}, journal = {Microelectron. Reliab.}, keywords = {}, pages = {464-468}, timestamp = {2023-12-13T09:44:42.000+0100}, title = {Internal processes in power semiconductors at virtual junction temperature measurement.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr64.html#ChenFHBL16}, volume = 64, year = 2016 }