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%0 Conference Paper
%1 journals/procedia/CanalRABMZGV11
%A Canal, Ramon
%A Rubio, Antonio
%A Asenov, A.
%A Brown, A.
%A Miranda, Miguel
%A Zuber, Paul
%A González, Antonio
%A Vera, Xavier
%B FET
%D 2011
%E Giacobino, Elisabeth
%E Pfeifer, Rolf
%I Elsevier
%K dblp
%P 148-149
%T TRAMS Project: Variability and Reliability of SRAM Memories in sub-22 nm Bulk-CMOS Technologies.
%U http://dblp.uni-trier.de/db/journals/procedia/procedia7.html#CanalRABMZGV11
%V 7
@inproceedings{journals/procedia/CanalRABMZGV11,
added-at = {2023-07-06T00:00:00.000+0200},
author = {Canal, Ramon and Rubio, Antonio and Asenov, A. and Brown, A. and Miranda, Miguel and Zuber, Paul and González, Antonio and Vera, Xavier},
biburl = {https://www.bibsonomy.org/bibtex/20b0f9345e2fe11f1331daf7cc8a7eb8c/dblp},
booktitle = {FET},
crossref = {conf/fet/2011},
editor = {Giacobino, Elisabeth and Pfeifer, Rolf},
ee = {https://doi.org/10.1016/j.procs.2011.09.010},
interhash = {d433d01937e7e4d06430ccc55dd22d97},
intrahash = {0b0f9345e2fe11f1331daf7cc8a7eb8c},
keywords = {dblp},
pages = {148-149},
publisher = {Elsevier},
series = {Procedia Computer Science},
timestamp = {2024-04-09T21:11:44.000+0200},
title = {TRAMS Project: Variability and Reliability of SRAM Memories in sub-22 nm Bulk-CMOS Technologies.},
url = {http://dblp.uni-trier.de/db/journals/procedia/procedia7.html#CanalRABMZGV11},
volume = 7,
year = 2011
}