%0 Journal Article %1 journals/mr/CerdeiraESI12 %A Cerdeira, Antonio %A Estrada, Magali %A Soto-Cruz, Blanca S. %A Iñíguez, Benjamín %D 2012 %J Microelectron. Reliab. %K dblp %N 11 %P 2532-2536 %T Modeling the behavior of amorphous oxide thin film transistors before and after bias stress. %U http://dblp.uni-trier.de/db/journals/mr/mr52.html#CerdeiraESI12 %V 52

@article{journals/mr/CerdeiraESI12, added-at = {2020-02-22T00:00:00.000+0100}, author = {Cerdeira, Antonio and Estrada, Magali and Soto-Cruz, Blanca S. and Iñíguez, Benjamín}, biburl = {https://www.bibsonomy.org/bibtex/294e083bba77c33844051507e2b709fc2/dblp}, ee = {https://doi.org/10.1016/j.microrel.2012.04.017}, interhash = {d5761818f4db465c57055d1e79448f35}, intrahash = {94e083bba77c33844051507e2b709fc2}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 11, pages = {2532-2536}, timestamp = {2020-02-25T13:29:55.000+0100}, title = {Modeling the behavior of amorphous oxide thin film transistors before and after bias stress.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr52.html#CerdeiraESI12}, volume = 52, year = 2012 }