%0 Conference Paper %1 conf/ats/DworakGCWWM00 %A Dworak, Jennifer %A Grimaila, Michael R. %A Cobb, Brad %A Wang, Ting-Chi %A Wang, Li-C. %A Mercer, M. Ray %B Asian Test Symposium %D 2000 %I IEEE Computer Society %K dblp %P 151- %T On the superiority of DO-RE-ME/MPG-D over stuck-at-based defective part level prediction. %U http://dblp.uni-trier.de/db/conf/ats/ats2000.html#DworakGCWWM00 %@ 0-7695-0887-1

@inproceedings{conf/ats/DworakGCWWM00, added-at = {2023-03-24T00:00:00.000+0100}, author = {Dworak, Jennifer and Grimaila, Michael R. and Cobb, Brad and Wang, Ting-Chi and Wang, Li-C. and Mercer, M. Ray}, biburl = {https://www.bibsonomy.org/bibtex/254bf54d4769f88ab8e8bcfa24775eb84/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2000}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2000.893618}, interhash = {da4b0c3c7a01cd0b07d33e8f7871f0d4}, intrahash = {54bf54d4769f88ab8e8bcfa24775eb84}, isbn = {0-7695-0887-1}, keywords = {dblp}, pages = {151-}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:35:42.000+0200}, title = {On the superiority of DO-RE-ME/MPG-D over stuck-at-based defective part level prediction.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2000.html#DworakGCWWM00}, year = 2000 }