%0 Conference Paper %1 conf/ets/MesallesVRC16 %A Mesalles, Francisco %A Villacorta, Hector %A Renovell, Michel %A Champac, Víctor H. %B ETS %D 2016 %I IEEE %K dblp %P 1-6 %T Behavior and test of open-gate defects in FinFET based cells. %U http://dblp.uni-trier.de/db/conf/ets/ets2016.html#MesallesVRC16 %@ 978-1-4673-9659-2

@inproceedings{conf/ets/MesallesVRC16, added-at = {2017-05-22T00:00:00.000+0200}, author = {Mesalles, Francisco and Villacorta, Hector and Renovell, Michel and Champac, Víctor H.}, biburl = {https://www.bibsonomy.org/bibtex/20f66b5353cb37c754e52f5628df47cb2/dblp}, booktitle = {ETS}, crossref = {conf/ets/2016}, ee = {https://doi.org/10.1109/ETS.2016.7519305}, interhash = {dd19f6e84e388a5f3eed26a8731c3403}, intrahash = {0f66b5353cb37c754e52f5628df47cb2}, isbn = {978-1-4673-9659-2}, keywords = {dblp}, pages = {1-6}, publisher = {IEEE}, timestamp = {2019-10-17T15:59:35.000+0200}, title = {Behavior and test of open-gate defects in FinFET based cells.}, url = {http://dblp.uni-trier.de/db/conf/ets/ets2016.html#MesallesVRC16}, year = 2016 }