%0 Conference Paper %1 conf/cicc/MasudaOKA05 %A Masuda, Hiroo %A ichi Ohkawa, Shin %A Kurokawa, Atsushi %A Aoki, Masakazu %B CICC %D 2005 %I IEEE %K dblp %P 593-599 %T Challenge: variability characterization and modeling for 65- to 90-nm processes. %U http://dblp.uni-trier.de/db/conf/cicc/cicc2005.html#MasudaOKA05 %@ 0-7803-9023-7

@inproceedings{conf/cicc/MasudaOKA05, added-at = {2017-05-17T00:00:00.000+0200}, author = {Masuda, Hiroo and ichi Ohkawa, Shin and Kurokawa, Atsushi and Aoki, Masakazu}, biburl = {https://www.bibsonomy.org/bibtex/27e914b54fb03d538ce53fb6e207a06fd/dblp}, booktitle = {CICC}, crossref = {conf/cicc/2005}, ee = {https://doi.org/10.1109/CICC.2005.1568738}, interhash = {dd417ff90828685966ac04e6858a3802}, intrahash = {7e914b54fb03d538ce53fb6e207a06fd}, isbn = {0-7803-9023-7}, keywords = {dblp}, pages = {593-599}, publisher = {IEEE}, timestamp = {2019-10-17T23:06:40.000+0200}, title = {Challenge: variability characterization and modeling for 65- to 90-nm processes.}, url = {http://dblp.uni-trier.de/db/conf/cicc/cicc2005.html#MasudaOKA05}, year = 2005 }