%0 Journal Article %1 journals/mr/HoKR15 %A Ho, Chih-Hsiang %A Kim, Soo Youn %A Roy, Kaushik %D 2015 %J Microelectron. Reliab. %K dblp %N 2 %P 308-317 %T Ultra-thin dielectric breakdown in devices and circuits: A brief review. %U http://dblp.uni-trier.de/db/journals/mr/mr55.html#HoKR15 %V 55

@article{journals/mr/HoKR15, added-at = {2020-02-22T00:00:00.000+0100}, author = {Ho, Chih-Hsiang and Kim, Soo Youn and Roy, Kaushik}, biburl = {https://www.bibsonomy.org/bibtex/2076c712ac325f706964d278ae06a9a85/dblp}, ee = {https://doi.org/10.1016/j.microrel.2014.10.019}, interhash = {de38ea167b044259d89acb1f5cd1e56b}, intrahash = {076c712ac325f706964d278ae06a9a85}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 2, pages = {308-317}, timestamp = {2020-02-25T13:25:23.000+0100}, title = {Ultra-thin dielectric breakdown in devices and circuits: A brief review.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr55.html#HoKR15}, volume = 55, year = 2015 }