%0 Journal Article %1 journals/et/IshidaNKKA16 %A Ishida, Masahiro %A Nakura, Toru %A Kusaka, Takashi %A Komatsu, Satoshi %A Asada, Kunihiro %D 2016 %J J. Electron. Test. %K dblp %N 3 %P 257-271 %T Dynamic Power Integrity Control of ATE for Eliminating Overkills and Underkills in Device Testing. %U http://dblp.uni-trier.de/db/journals/et/et32.html#IshidaNKKA16 %V 32

@article{journals/et/IshidaNKKA16, added-at = {2020-09-11T00:00:00.000+0200}, author = {Ishida, Masahiro and Nakura, Toru and Kusaka, Takashi and Komatsu, Satoshi and Asada, Kunihiro}, biburl = {https://www.bibsonomy.org/bibtex/2b8bc32bf4f756a1d13a590576e6f15c8/dblp}, ee = {https://doi.org/10.1007/s10836-016-5582-4}, interhash = {dee7ec4d90037104901b508186e64906}, intrahash = {b8bc32bf4f756a1d13a590576e6f15c8}, journal = {J. Electron. Test.}, keywords = {dblp}, number = 3, pages = {257-271}, timestamp = {2020-09-12T11:41:17.000+0200}, title = {Dynamic Power Integrity Control of ATE for Eliminating Overkills and Underkills in Device Testing.}, url = {http://dblp.uni-trier.de/db/journals/et/et32.html#IshidaNKKA16}, volume = 32, year = 2016 }