%0 Conference Paper %1 conf/ets/SimonBRKM17 %A Simon, Sebastian %A Bhat, Deeksha %A Rath, Alexander W. %A Kirscher, Jérôme %A Maurer, Linus %B ETS %D 2017 %I IEEE %K dblp %P 1-6 %T Coverage-driven mixed-signal verification of smart power ICs in a UVM environment. %U http://dblp.uni-trier.de/db/conf/ets/ets2017.html#SimonBRKM17 %@ 978-1-5090-5457-2

@inproceedings{conf/ets/SimonBRKM17, added-at = {2017-07-13T00:00:00.000+0200}, author = {Simon, Sebastian and Bhat, Deeksha and Rath, Alexander W. and Kirscher, Jérôme and Maurer, Linus}, biburl = {https://www.bibsonomy.org/bibtex/246d0c985b94eb2ab1aa59bc9c478a189/dblp}, booktitle = {ETS}, crossref = {conf/ets/2017}, ee = {https://doi.org/10.1109/ETS.2017.7968237}, interhash = {df0c037943746204961592819f00233a}, intrahash = {46d0c985b94eb2ab1aa59bc9c478a189}, isbn = {978-1-5090-5457-2}, keywords = {dblp}, pages = {1-6}, publisher = {IEEE}, timestamp = {2019-10-17T15:59:11.000+0200}, title = {Coverage-driven mixed-signal verification of smart power ICs in a UVM environment.}, url = {http://dblp.uni-trier.de/db/conf/ets/ets2017.html#SimonBRKM17}, year = 2017 }