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%0 Journal Article
%1 journals/tvlsi/AzevedoVBDGTAM14
%A Azevedo, Joao
%A Virazel, Arnaud
%A Bosio, Alberto
%A Dilillo, Luigi
%A Girard, Patrick
%A Todri-Sanial, Aida
%A Alvarez-Herault, Jérémy
%A Mackay, Ken
%D 2014
%J IEEE Trans. Very Large Scale Integr. Syst.
%K dblp
%N 11
%P 2326-2335
%T A Complete Resistive-Open Defect Analysis for Thermally Assisted Switching MRAMs.
%U http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi22.html#AzevedoVBDGTAM14
%V 22
@article{journals/tvlsi/AzevedoVBDGTAM14,
added-at = {2023-03-21T00:00:00.000+0100},
author = {Azevedo, Joao and Virazel, Arnaud and Bosio, Alberto and Dilillo, Luigi and Girard, Patrick and Todri-Sanial, Aida and Alvarez-Herault, Jérémy and Mackay, Ken},
biburl = {https://www.bibsonomy.org/bibtex/2b57cc9f575cbbb2cd4462fa11955e2b9/dblp},
ee = {https://doi.org/10.1109/TVLSI.2013.2294080},
interhash = {e1efde76f1aa001ebf22965a536cd927},
intrahash = {b57cc9f575cbbb2cd4462fa11955e2b9},
journal = {IEEE Trans. Very Large Scale Integr. Syst.},
keywords = {dblp},
number = 11,
pages = {2326-2335},
timestamp = {2024-04-08T14:32:42.000+0200},
title = {A Complete Resistive-Open Defect Analysis for Thermally Assisted Switching MRAMs.},
url = {http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi22.html#AzevedoVBDGTAM14},
volume = 22,
year = 2014
}
