%0 Conference Paper %1 conf/ats/HuynhZKDS99 %A Huynh, Sam D. %A Zhang, Jinyan %A Kim, Seongwon %A Devarayanadurg, Giri %A Soma, Mani %B Asian Test Symposium %D 1999 %I IEEE Computer Society %K dblp %P 239- %T Efficient Test Set Design for Analog and Mixed-Signal Circuits and Systems. %U http://dblp.uni-trier.de/db/conf/ats/ats1999.html#HuynhZKDS99 %@ 0-7695-0315-2

@inproceedings{conf/ats/HuynhZKDS99, added-at = {2023-03-24T00:00:00.000+0100}, author = {Huynh, Sam D. and Zhang, Jinyan and Kim, Seongwon and Devarayanadurg, Giri and Soma, Mani}, biburl = {https://www.bibsonomy.org/bibtex/2125ebc8216ca8e8f3a02cf20358d3637/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/1999}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.1999.810757}, interhash = {e2b75af501a164d839b290f78dc53450}, intrahash = {125ebc8216ca8e8f3a02cf20358d3637}, isbn = {0-7695-0315-2}, keywords = {dblp}, pages = {239-}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:36:07.000+0200}, title = {Efficient Test Set Design for Analog and Mixed-Signal Circuits and Systems.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats1999.html#HuynhZKDS99}, year = 1999 }