%0 Conference Paper %1 conf/dac/MajumdarS92 %A Majumdar, Amitava %A Sastry, Sarma %B DAC %D 1992 %E Schweikert, Daniel G. %I IEEE Computer Society Press %K dblp %P 341-346 %T On the Distribution of Fault Coverage and Test length in Random Testing of Combinational Circuits. %U http://dblp.uni-trier.de/db/conf/dac/dac92.html#MajumdarS92 %@ 0-8186-2822-7

@inproceedings{conf/dac/MajumdarS92, added-at = {2017-03-16T00:00:00.000+0100}, author = {Majumdar, Amitava and Sastry, Sarma}, biburl = {https://www.bibsonomy.org/bibtex/27ac8b9b2f3d88f167faccf4c02fb0ad2/dblp}, booktitle = {DAC}, crossref = {conf/dac/1992}, editor = {Schweikert, Daniel G.}, ee = {http://portal.acm.org/citation.cfm?id=113938.149485}, interhash = {e39d8f0ea4ee982b20d8667cd21d76e0}, intrahash = {7ac8b9b2f3d88f167faccf4c02fb0ad2}, isbn = {0-8186-2822-7}, keywords = {dblp}, pages = {341-346}, publisher = {IEEE Computer Society Press}, timestamp = {2017-03-17T11:40:52.000+0100}, title = {On the Distribution of Fault Coverage and Test length in Random Testing of Combinational Circuits.}, url = {http://dblp.uni-trier.de/db/conf/dac/dac92.html#MajumdarS92}, year = 1992 }