%0 Conference Paper %1 conf/dft/MaheshwariKB03 %A Maheshwari, Atul %A Koren, Israel %A Burleson, Wayne P. %B DFT %D 2003 %I IEEE Computer Society %K dblp %P 597- %T Techniques for Transient Fault Sensitivity Analysis and Reduction in VLSI Circuits. %U http://dblp.uni-trier.de/db/conf/dft/dft2003.html#MaheshwariKB03 %@ 0-7695-2042-1

@inproceedings{conf/dft/MaheshwariKB03, added-at = {2023-03-24T00:00:00.000+0100}, author = {Maheshwari, Atul and Koren, Israel and Burleson, Wayne P.}, biburl = {https://www.bibsonomy.org/bibtex/252780855c3869ab9b27aac103e65d409/dblp}, booktitle = {DFT}, crossref = {conf/dft/2003}, ee = {https://doi.ieeecomputersociety.org/10.1109/DFTVS.2003.1250160}, interhash = {e404e721fce52784bcae69fdab122263}, intrahash = {52780855c3869ab9b27aac103e65d409}, isbn = {0-7695-2042-1}, keywords = {dblp}, pages = {597-}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T12:56:29.000+0200}, title = {Techniques for Transient Fault Sensitivity Analysis and Reduction in VLSI Circuits.}, url = {http://dblp.uni-trier.de/db/conf/dft/dft2003.html#MaheshwariKB03}, year = 2003 }