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%0 Conference Paper
%1 conf/ats/AgrawalCHKLMC95
%A Agrawal, Vishwani D.
%A Courtois, Bernard
%A Hirose, Fumiyasu
%A Kundu, Sandip
%A Lee, Chung-Len
%A Min, Yinghua
%A Chaudhuri, P. Pal
%B Asian Test Symposium
%D 1995
%I IEEE Computer Society
%K
%P 189-190
%T Panel: New Research Problems in the Emerging Test Technology.
%U http://dblp.uni-trier.de/db/conf/ats/ats1995.html#AgrawalCHKLMC95
%@ 0-8186-7129-7
@inproceedings{conf/ats/AgrawalCHKLMC95,
added-at = {2023-12-14T14:57:27.000+0100},
author = {Agrawal, Vishwani D. and Courtois, Bernard and Hirose, Fumiyasu and Kundu, Sandip and Lee, Chung-Len and Min, Yinghua and Chaudhuri, P. Pal},
biburl = {https://www.bibsonomy.org/bibtex/29ae880be575be02fcb74c33326310836/admin},
booktitle = {Asian Test Symposium},
crossref = {conf/ats/1995},
ee = {http://doi.ieeecomputersociety.org/10.1109/ATS.1995.10006},
interhash = {e56261335d05cfcd385f9241b8090b97},
intrahash = {9ae880be575be02fcb74c33326310836},
isbn = {0-8186-7129-7},
keywords = {},
pages = {189-190},
publisher = {IEEE Computer Society},
timestamp = {2023-12-14T14:57:27.000+0100},
title = {Panel: New Research Problems in the Emerging Test Technology.},
url = {http://dblp.uni-trier.de/db/conf/ats/ats1995.html#AgrawalCHKLMC95},
year = 1995
}