%0 Conference Paper %1 conf/ats/HamidaSMK97 %A Ben-Hamida, Naim %A Saab, Khaled %A Marche, David %A Kaminska, Bozena %B Asian Test Symposium %D 1997 %I IEEE Computer Society %K dblp %P 182-187 %T A perturbation based fault modeling and simulation for mixed-signal circuits. %U http://dblp.uni-trier.de/db/conf/ats/ats1997.html#HamidaSMK97 %@ 0-8186-8209-4

@inproceedings{conf/ats/HamidaSMK97, added-at = {2023-06-22T00:00:00.000+0200}, author = {Ben-Hamida, Naim and Saab, Khaled and Marche, David and Kaminska, Bozena}, biburl = {https://www.bibsonomy.org/bibtex/2a89cfe4bfe4371773e44d563cc1af8c1/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/1997}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.1997.643956}, interhash = {e59b1895a195238110ef5fa528eecce2}, intrahash = {a89cfe4bfe4371773e44d563cc1af8c1}, isbn = {0-8186-8209-4}, keywords = {dblp}, pages = {182-187}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:36:16.000+0200}, title = {A perturbation based fault modeling and simulation for mixed-signal circuits.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats1997.html#HamidaSMK97}, year = 1997 }