%0 Journal Article %1 journals/mr/ZhongZXGWS13 %A Zhong, Xueqian %A Zhang, Li %A Xie, Gang %A Guo, Qing %A Wang, Tao %A Sheng, Kuang %D 2013 %J Microelectron. Reliab. %K dblp %N 12 %P 1848-1856 %T High temperature physical modeling and verification of a novel 4H-SiC lateral JFET structure. %U http://dblp.uni-trier.de/db/journals/mr/mr53.html#ZhongZXGWS13 %V 53

@article{journals/mr/ZhongZXGWS13, added-at = {2020-02-22T00:00:00.000+0100}, author = {Zhong, Xueqian and Zhang, Li and Xie, Gang and Guo, Qing and Wang, Tao and Sheng, Kuang}, biburl = {https://www.bibsonomy.org/bibtex/284f7889278f5f7fb9e84a678bb994178/dblp}, ee = {https://doi.org/10.1016/j.microrel.2013.05.003}, interhash = {e6b7252a2f476f09b2a8d958c5833f26}, intrahash = {84f7889278f5f7fb9e84a678bb994178}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 12, pages = {1848-1856}, timestamp = {2020-02-25T13:26:06.000+0100}, title = {High temperature physical modeling and verification of a novel 4H-SiC lateral JFET structure.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr53.html#ZhongZXGWS13}, volume = 53, year = 2013 }