Inproceedings,
Towards Security-Aware Mutation Testing.
T. Loise, X. Devroey, G. Perrouin, M. Papadakis, and P. Heymans.ICST Workshops, page 97-102. IEEE Computer Society, (2017)
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- BibTeX key
- conf/icst/LoiseDPPH17
- entry type
- inproceedings
- booktitle
- ICST Workshops
- year
- 2017
- pages
- 97-102
- publisher
- IEEE Computer Society
- crossref
- conf/icst/2017w
- ee
- https://doi.org/10.1109/ICSTW.2017.24
- isbn
- 978-1-5090-6676-6
- url
- http://dblp.uni-trier.de/db/conf/icst/icstw2017.html#LoiseDPPH17
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- please select -%0 Conference Paper
%1 conf/icst/LoiseDPPH17
%A Loise, Thomas
%A Devroey, Xavier
%A Perrouin, Gilles
%A Papadakis, Mike
%A Heymans, Patrick
%B ICST Workshops
%D 2017
%I IEEE Computer Society
%K dblp
%P 97-102
%T Towards Security-Aware Mutation Testing.
%U http://dblp.uni-trier.de/db/conf/icst/icstw2017.html#LoiseDPPH17
%@ 978-1-5090-6676-6
@inproceedings{conf/icst/LoiseDPPH17,
added-at = {2021-10-14T00:00:00.000+0200},
author = {Loise, Thomas and Devroey, Xavier and Perrouin, Gilles and Papadakis, Mike and Heymans, Patrick},
biburl = {https://www.bibsonomy.org/bibtex/2b53a265fe3ea77b6cec8818a1bf4ff4b/dblp},
booktitle = {ICST Workshops},
crossref = {conf/icst/2017w},
ee = {https://doi.org/10.1109/ICSTW.2017.24},
interhash = {e85427d72619e25b9f173b76c6c5ff8b},
intrahash = {b53a265fe3ea77b6cec8818a1bf4ff4b},
isbn = {978-1-5090-6676-6},
keywords = {dblp},
pages = {97-102},
publisher = {IEEE Computer Society},
timestamp = {2024-04-10T16:24:43.000+0200},
title = {Towards Security-Aware Mutation Testing.},
url = {http://dblp.uni-trier.de/db/conf/icst/icstw2017.html#LoiseDPPH17},
year = 2017
}