%0 Journal Article %1 journals/tce/SuHYLLJABW24 %A Su, Jie %A Hong, Zhen %A Ye, Lei %A Liu, Tao %A Liang, Sizhuang %A Ji, Shouling %A Aujla, Gagangeet Singh %A Beyah, Reheem %A Wen, Zhenyu %D 2024 %J IEEE Trans. Consumer Electron. %K dblp %N 1 %P 4605-4616 %T Trustworthy IAP: An Intelligent Applications Profiler to Investigate Vulnerabilities of Consumer Electronic Devices. %U http://dblp.uni-trier.de/db/journals/tce/tce70.html#SuHYLLJABW24 %V 70

@article{journals/tce/SuHYLLJABW24, added-at = {2024-05-17T00:00:00.000+0200}, author = {Su, Jie and Hong, Zhen and Ye, Lei and Liu, Tao and Liang, Sizhuang and Ji, Shouling and Aujla, Gagangeet Singh and Beyah, Reheem and Wen, Zhenyu}, biburl = {https://www.bibsonomy.org/bibtex/298a1f03653c618b0bdd4f67fa2491085/dblp}, ee = {https://doi.org/10.1109/TCE.2023.3347651}, interhash = {e8b4ec8a31e2d713f6028ea9f8dfa55b}, intrahash = {98a1f03653c618b0bdd4f67fa2491085}, journal = {IEEE Trans. Consumer Electron.}, keywords = {dblp}, month = {February}, number = 1, pages = {4605-4616}, timestamp = {2024-05-20T07:08:31.000+0200}, title = {Trustworthy IAP: An Intelligent Applications Profiler to Investigate Vulnerabilities of Consumer Electronic Devices.}, url = {http://dblp.uni-trier.de/db/journals/tce/tce70.html#SuHYLLJABW24}, volume = 70, year = 2024 }