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%0 Conference Paper
%1 Kuhn_17
%A Kuhn, D. Richard
%A Kacker, Raghu N.
%A Lei, Yu
%B IEEE International Conference on Software Testing, Verification and Validation Workshops
%D 2017
%K
%P 162--170
%T A Model for t-way Fault Profile Evolution During Testing
@inproceedings{Kuhn_17,
added-at = {2023-12-14T15:18:59.000+0100},
author = {Kuhn, D. Richard and Kacker, Raghu N. and Lei, Yu},
biburl = {https://www.bibsonomy.org/bibtex/292c3b5712474df068921d74d75a5feec/admin},
booktitle = {IEEE International Conference on Software Testing, Verification and Validation Workshops},
data = {paper},
interhash = {e9a867ea96c04c12752758a9efbcf774},
intrahash = {92c3b5712474df068921d74d75a5feec},
keywords = {},
month = mar,
online = {fault-profile-iwct17.pdf},
pages = {162--170},
series = {ICSTW 2017},
timestamp = {2023-12-14T15:18:59.000+0100},
title = {A Model for t-way Fault Profile Evolution During Testing},
year = 2017
}
