%0 Conference Paper %1 conf/vlsid/Parekhji03 %A Parekhji, Rubin A. %B VLSI Design %D 2003 %I IEEE Computer Society %K dblp %P 17 %T Testing Embedded Cores and SOCs-DFT, ATPG and BIST Solutions. %U http://dblp.uni-trier.de/db/conf/vlsid/vlsid2003.html#Parekhji03 %@ 0-7695-1868-0

@inproceedings{conf/vlsid/Parekhji03, added-at = {2023-03-24T00:00:00.000+0100}, author = {Parekhji, Rubin A.}, biburl = {https://www.bibsonomy.org/bibtex/2ab25b7e466d17cb471045aab9d3f78c9/dblp}, booktitle = {VLSI Design}, crossref = {conf/vlsid/2003}, ee = {https://doi.ieeecomputersociety.org/10.1109/ICVD.2003.1183106}, interhash = {ea203149740478a8baf1ef079d47dcbb}, intrahash = {ab25b7e466d17cb471045aab9d3f78c9}, isbn = {0-7695-1868-0}, keywords = {dblp}, pages = 17, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:18:49.000+0200}, title = {Testing Embedded Cores and SOCs-DFT, ATPG and BIST Solutions.}, url = {http://dblp.uni-trier.de/db/conf/vlsid/vlsid2003.html#Parekhji03}, year = 2003 }