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%0 Journal Article
%1 journals/mr/PetitMZSFM05
%A Petit, Christian
%A Meinertzhagen, A.
%A Zander, Damien
%A Simonetti, O.
%A Fadlallah, M.
%A Maurel, T.
%D 2005
%J Microelectron. Reliab.
%K dblp
%N 3-4
%P 479-485
%T Low voltage SILC and P- and N-MOSFET gate oxide reliability.
%U http://dblp.uni-trier.de/db/journals/mr/mr45.html#PetitMZSFM05
%V 45
@article{journals/mr/PetitMZSFM05,
added-at = {2022-06-17T00:00:00.000+0200},
author = {Petit, Christian and Meinertzhagen, A. and Zander, Damien and Simonetti, O. and Fadlallah, M. and Maurel, T.},
biburl = {https://www.bibsonomy.org/bibtex/206c7d8fa1de0ea5ec6745f8822952276/dblp},
ee = {https://doi.org/10.1016/j.microrel.2004.08.002},
interhash = {ea5b15a2555bbf219ed990229541313c},
intrahash = {06c7d8fa1de0ea5ec6745f8822952276},
journal = {Microelectron. Reliab.},
keywords = {dblp},
number = {3-4},
pages = {479-485},
timestamp = {2024-04-09T02:48:44.000+0200},
title = {Low voltage SILC and P- and N-MOSFET gate oxide reliability.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr45.html#PetitMZSFM05},
volume = 45,
year = 2005
}