%0 Journal Article %1 journals/mr/EstradaRGACPMQ16 %A Estrada, Magali %A Rivas, M. %A Garduño, Ivan %A Avila-Herrera, F. %A Cerdeira, Antonio %A Pavanello, Marcelo Antonio %A Mejia, Israel %A Quevedo-Lopez, M. A. %D 2016 %J Microelectron. Reliab. %K dblp %P 29-33 %T Temperature dependence of the electrical characteristics up to 370 K of amorphous In-Ga-ZnO thin film transistors. %U http://dblp.uni-trier.de/db/journals/mr/mr56.html#EstradaRGACPMQ16 %V 56

@article{journals/mr/EstradaRGACPMQ16, added-at = {2021-05-10T00:00:00.000+0200}, author = {Estrada, Magali and Rivas, M. and Garduño, Ivan and Avila-Herrera, F. and Cerdeira, Antonio and Pavanello, Marcelo Antonio and Mejia, Israel and Quevedo-Lopez, M. A.}, biburl = {https://www.bibsonomy.org/bibtex/286feb8d56fcf4069a7170b689243c3ce/dblp}, ee = {https://doi.org/10.1016/j.microrel.2015.10.015}, interhash = {eb7fefe6d29bb85acef284219679aa3e}, intrahash = {86feb8d56fcf4069a7170b689243c3ce}, journal = {Microelectron. Reliab.}, keywords = {dblp}, pages = {29-33}, timestamp = {2024-04-09T02:49:59.000+0200}, title = {Temperature dependence of the electrical characteristics up to 370 K of amorphous In-Ga-ZnO thin film transistors.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr56.html#EstradaRGACPMQ16}, volume = 56, year = 2016 }