%0 Journal Article %1 journals/mr/CastellazziCFPM07 %A Castellazzi, Alberto %A Ciappa, Mauro %A Fichtner, Wolfgang %A Piton, M. %A Mermet-Guyennet, Michel %D 2007 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1713-1718 %T A study of the threshold-voltage suitability as an application-related reliability indicator for planar-gate non-punch-through IGBTs. %U http://dblp.uni-trier.de/db/journals/mr/mr47.html#CastellazziCFPM07 %V 47

@article{journals/mr/CastellazziCFPM07, added-at = {2020-02-22T00:00:00.000+0100}, author = {Castellazzi, Alberto and Ciappa, Mauro and Fichtner, Wolfgang and Piton, M. and Mermet-Guyennet, Michel}, biburl = {https://www.bibsonomy.org/bibtex/2adc20b77890588cd7ec736ca921c231a/dblp}, ee = {https://doi.org/10.1016/j.microrel.2007.07.035}, interhash = {ed38291477c0a63cd6e7efd6fc9a981d}, intrahash = {adc20b77890588cd7ec736ca921c231a}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1713-1718}, timestamp = {2020-02-25T13:29:10.000+0100}, title = {A study of the threshold-voltage suitability as an application-related reliability indicator for planar-gate non-punch-through IGBTs.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr47.html#CastellazziCFPM07}, volume = 47, year = 2007 }