%0 Conference Paper %1 conf/ets/AppelloBCGGSR09 %A Appello, Davide %A Bernardi, Paolo %A Cagliesi, R. %A Giancarlini, M. %A Grosso, Michelangelo %A Sánchez, Edgar E. %A Reorda, Matteo Sonza %B ETS %D 2009 %I IEEE Computer Society %K dblp %P 93-98 %T Automatic Functional Stress Pattern Generation for SoC Reliability Characterization. %U http://dblp.uni-trier.de/db/conf/ets/ets2009.html#AppelloBCGGSR09 %@ 978-0-7695-3703-0

@inproceedings{conf/ets/AppelloBCGGSR09, added-at = {2023-03-23T00:00:00.000+0100}, author = {Appello, Davide and Bernardi, Paolo and Cagliesi, R. and Giancarlini, M. and Grosso, Michelangelo and Sánchez, Edgar E. and Reorda, Matteo Sonza}, biburl = {https://www.bibsonomy.org/bibtex/2246aab55387bd872c048f87dab98b58f/dblp}, booktitle = {ETS}, crossref = {conf/ets/2009}, ee = {https://www.wikidata.org/entity/Q60246000}, interhash = {edb3047d7298238ae143267a5c4932c7}, intrahash = {246aab55387bd872c048f87dab98b58f}, isbn = {978-0-7695-3703-0}, keywords = {dblp}, pages = {93-98}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T20:47:13.000+0200}, title = {Automatic Functional Stress Pattern Generation for SoC Reliability Characterization.}, url = {http://dblp.uni-trier.de/db/conf/ets/ets2009.html#AppelloBCGGSR09}, year = 2009 }