%0 Journal Article %1 journals/mr/TannerPCWWBW07 %A Tanner, D. M. %A Parson, T. B. %A Corwin, A. D. %A Walraven, Jeremy A. %A Wittwer, J. W. %A Boyce, B. L. %A Winzer, S. R. %D 2007 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1806-1811 %T Science-based MEMS reliability methodology. %U http://dblp.uni-trier.de/db/journals/mr/mr47.html#TannerPCWWBW07 %V 47

@article{journals/mr/TannerPCWWBW07, added-at = {2020-02-22T00:00:00.000+0100}, author = {Tanner, D. M. and Parson, T. B. and Corwin, A. D. and Walraven, Jeremy A. and Wittwer, J. W. and Boyce, B. L. and Winzer, S. R.}, biburl = {https://www.bibsonomy.org/bibtex/215e886f7e3d38f0056f746b627ae052e/dblp}, ee = {https://doi.org/10.1016/j.microrel.2007.07.061}, interhash = {efacfde1651810fe61e49895938a1079}, intrahash = {15e886f7e3d38f0056f746b627ae052e}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1806-1811}, timestamp = {2020-02-25T13:27:39.000+0100}, title = {Science-based MEMS reliability methodology.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr47.html#TannerPCWWBW07}, volume = 47, year = 2007 }