%0 Conference Paper %1 conf/vts/LeeB91 %A Lee, Kuen-Jong %A Breuer, Melvin A. %B VTS %D 1991 %I IEEE Computer Society %K dblp %P 303-308 %T Constraints for using IDDQ testing to detect CMOS bridging faults. %U http://dblp.uni-trier.de/db/conf/vts/vts1991.html#LeeB91

@inproceedings{conf/vts/LeeB91, added-at = {2023-03-24T00:00:00.000+0100}, author = {Lee, Kuen-Jong and Breuer, Melvin A.}, biburl = {https://www.bibsonomy.org/bibtex/2ec6c8dc69169c76e57110da41b37413d/dblp}, booktitle = {VTS}, crossref = {conf/vts/1991}, ee = {https://doi.ieeecomputersociety.org/10.1109/VTEST.1991.208175}, interhash = {f5720d27f1a92ec61dfe5315324f7716}, intrahash = {ec6c8dc69169c76e57110da41b37413d}, keywords = {dblp}, pages = {303-308}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T07:35:10.000+0200}, title = {Constraints for using IDDQ testing to detect CMOS bridging faults.}, url = {http://dblp.uni-trier.de/db/conf/vts/vts1991.html#LeeB91}, year = 1991 }