%0 Journal Article %1 journals/mr/TeramotoUAKSKOS01 %A Teramoto, Akinobu %A Umeda, H. %A Azamawari, K. %A Kobayashi, Kiyoteru %A Shiga, K. %A Komori, J. %A Ohno, Y. %A Shigetomi, A. %D 2001 %J Microelectron. Reliab. %K dblp %N 1 %P 47-52 %T Time-dependent dielectric breakdown of SiO2 films in a wide electric field range. %U http://dblp.uni-trier.de/db/journals/mr/mr41.html#TeramotoUAKSKOS01 %V 41

@article{journals/mr/TeramotoUAKSKOS01, added-at = {2023-10-27T00:00:00.000+0200}, author = {Teramoto, Akinobu and Umeda, H. and Azamawari, K. and Kobayashi, Kiyoteru and Shiga, K. and Komori, J. and Ohno, Y. and Shigetomi, A.}, biburl = {https://www.bibsonomy.org/bibtex/2c4244e39761f2fe9fb5cee73c489e32f/dblp}, ee = {https://doi.org/10.1016/S0026-2714(00)00095-0}, interhash = {f69fbd1e47edad51d3a428356a4c9ff3}, intrahash = {c4244e39761f2fe9fb5cee73c489e32f}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 1, pages = {47-52}, timestamp = {2024-04-09T02:49:06.000+0200}, title = {Time-dependent dielectric breakdown of SiO2 films in a wide electric field range.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr41.html#TeramotoUAKSKOS01}, volume = 41, year = 2001 }