%0 Journal Article %1 journals/mr/PotterMSARG14 %A Potter, Kenneth %A Morgan, Katrina A. %A Shaw, Chris %A Ashburn, Peter %A Redman-White, William %A Groot, C. H. De %D 2014 %J Microelectron. Reliab. %K dblp %N 9-10 %P 2339-2343 %T Total ionizing dose response of fluorine implanted Silicon-On-Insulator buried oxide. %U http://dblp.uni-trier.de/db/journals/mr/mr54.html#PotterMSARG14 %V 54

@article{journals/mr/PotterMSARG14, added-at = {2020-02-22T00:00:00.000+0100}, author = {Potter, Kenneth and Morgan, Katrina A. and Shaw, Chris and Ashburn, Peter and Redman-White, William and Groot, C. H. De}, biburl = {https://www.bibsonomy.org/bibtex/2128781f5c7a019bcbaf39f6bfa577bee/dblp}, ee = {https://doi.org/10.1016/j.microrel.2014.07.018}, interhash = {f823848f0939c1122c84460dd584243b}, intrahash = {128781f5c7a019bcbaf39f6bfa577bee}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-10}, pages = {2339-2343}, timestamp = {2020-02-25T13:29:10.000+0100}, title = {Total ionizing dose response of fluorine implanted Silicon-On-Insulator buried oxide.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr54.html#PotterMSARG14}, volume = 54, year = 2014 }