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%0 Conference Paper
%1 conf/mtdt/WangMCD06
%A Wang, Hua
%A Miranda, Miguel
%A Catthoor, Francky
%A Dehaene, Wim
%B MTDT
%D 2006
%I IEEE Computer Society
%K dblp
%P 71-76
%T On the Combined Impact of Soft and Medium Gate Oxide Breakdown and Process Variability on the Parametric Figures of SRAM components.
%U http://dblp.uni-trier.de/db/conf/mtdt/mtdt2006.html#WangMCD06
%@ 0-7695-2572-5
@inproceedings{conf/mtdt/WangMCD06,
added-at = {2023-03-24T00:00:00.000+0100},
author = {Wang, Hua and Miranda, Miguel and Catthoor, Francky and Dehaene, Wim},
biburl = {https://www.bibsonomy.org/bibtex/2d51a56b1b85edc6b5ca8226b72d6fbca/dblp},
booktitle = {MTDT},
crossref = {conf/mtdt/2006},
ee = {https://doi.ieeecomputersociety.org/10.1109/MTDT.2006.23},
interhash = {f8d7a3b1d5937c06b68a101a8e4b74d5},
intrahash = {d51a56b1b85edc6b5ca8226b72d6fbca},
isbn = {0-7695-2572-5},
keywords = {dblp},
pages = {71-76},
publisher = {IEEE Computer Society},
timestamp = {2024-04-10T16:53:54.000+0200},
title = {On the Combined Impact of Soft and Medium Gate Oxide Breakdown and Process Variability on the Parametric Figures of SRAM components.},
url = {http://dblp.uni-trier.de/db/conf/mtdt/mtdt2006.html#WangMCD06},
year = 2006
}