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%0 Journal Article
%1 journals/tse/ParrishZ95
%A Parrish, Allen S.
%A Zweben, Stuart H.
%D 1995
%J IEEE Trans. Software Eng.
%K dblp
%N 12
%P 1006-1009
%T On the Relationships Among the All-Uses, All-DU-Paths, and All-Edges Testing Criteria.
%U http://dblp.uni-trier.de/db/journals/tse/tse21.html#ParrishZ95
%V 21
@article{journals/tse/ParrishZ95,
added-at = {2015-12-10T00:00:00.000+0100},
author = {Parrish, Allen S. and Zweben, Stuart H.},
biburl = {https://www.bibsonomy.org/bibtex/2fa96adb28046530874b594bdf6f4944a/dblp},
ee = {http://doi.ieeecomputersociety.org/10.1109/32.489075},
interhash = {fb85f691cc2d90c3434f0a7ceb8d6de2},
intrahash = {fa96adb28046530874b594bdf6f4944a},
journal = {IEEE Trans. Software Eng.},
keywords = {dblp},
number = 12,
pages = {1006-1009},
timestamp = {2015-12-12T11:53:11.000+0100},
title = {On the Relationships Among the All-Uses, All-DU-Paths, and All-Edges Testing Criteria.},
url = {http://dblp.uni-trier.de/db/journals/tse/tse21.html#ParrishZ95},
volume = 21,
year = 1995
}