Abstract
We use the macroscopic dielectric continuum model to calculate the
dispersion relation of interface localized optical-phonon modes in GaN
thin films grown on 6H-SiC or sapphire substrate, considering the
presence of a multilayered AI(x)Gal(1-x)N interfacial region between the
film and the substrate. The main influence of the number of layers n at
the interface, which depends on the molar concentration x of the alloy
AI(x)Gal(1-x)N, is to preclude localization of interface phonons. A
small change on the phonon frequencies and branch slopes is also
observed. (C) 2005 Elsevier B.V. All rights reserved.
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