Article,

Interface optical phonon localization in graded GaN thin films

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PHYSICS LETTERS A, 336 (2-3): 259-263 (2005)
DOI: 10.1016/j.physleta.2005.01.007

Abstract

We use the macroscopic dielectric continuum model to calculate the dispersion relation of interface localized optical-phonon modes in GaN thin films grown on 6H-SiC or sapphire substrate, considering the presence of a multilayered AI(x)Gal(1-x)N interfacial region between the film and the substrate. The main influence of the number of layers n at the interface, which depends on the molar concentration x of the alloy AI(x)Gal(1-x)N, is to preclude localization of interface phonons. A small change on the phonon frequencies and branch slopes is also observed. (C) 2005 Elsevier B.V. All rights reserved.

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