%0 Conference Paper %1 conf/irps/McGloneBVIHG20 %A McGlone, John M. %A Brizar, Guy %A Vanderstraeten, Daniel %A Iyer, Dorai %A Hose, Sallie %A Gambino, Jeff P. %B IRPS %D 2020 %I IEEE %K dblp %P 1-5 %T Effect of Residual TiN on Reliability of Au Wire Bonds during High Temperature Storage. %U http://dblp.uni-trier.de/db/conf/irps/irps2020.html#McGloneBVIHG20 %@ 978-1-7281-3199-3

@inproceedings{conf/irps/McGloneBVIHG20, added-at = {2021-01-20T00:00:00.000+0100}, author = {McGlone, John M. and Brizar, Guy and Vanderstraeten, Daniel and Iyer, Dorai and Hose, Sallie and Gambino, Jeff P.}, biburl = {https://www.bibsonomy.org/bibtex/2b2a32c9a5ccffccd9f104f46aad4090d/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2020}, ee = {https://doi.org/10.1109/IRPS45951.2020.9128891}, interhash = {fe44af9cf215396cd89eac00008c7842}, intrahash = {b2a32c9a5ccffccd9f104f46aad4090d}, isbn = {978-1-7281-3199-3}, keywords = {dblp}, pages = {1-5}, publisher = {IEEE}, timestamp = {2024-04-10T16:56:46.000+0200}, title = {Effect of Residual TiN on Reliability of Au Wire Bonds during High Temperature Storage.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2020.html#McGloneBVIHG20}, year = 2020 }