%0 Conference Paper %1 conf/fpl/AhmedZTB16 %A Ahmed, Ibrahim %A Zhao, Shuze %A Trescases, Olivier %A Betz, Vaughn %B FPL %D 2016 %E Ienne, Paolo %E Najjar, Walid A. %E Anderson, Jason Helge %E Brisk, Philip %E Stechele, Walter %I IEEE %K dblp %P 1-11 %T Measure twice and cut once: Robust dynamic voltage scaling for FPGAs. %U http://dblp.uni-trier.de/db/conf/fpl/fpl2016.html#AhmedZTB16 %@ 978-2-8399-1844-2

@inproceedings{conf/fpl/AhmedZTB16, added-at = {2019-02-18T00:00:00.000+0100}, author = {Ahmed, Ibrahim and Zhao, Shuze and Trescases, Olivier and Betz, Vaughn}, biburl = {https://www.bibsonomy.org/bibtex/2a86f2927086bc9a832f3a38bc1ba6838/dblp}, booktitle = {FPL}, crossref = {conf/fpl/2016}, editor = {Ienne, Paolo and Najjar, Walid A. and Anderson, Jason Helge and Brisk, Philip and Stechele, Walter}, ee = {https://doi.org/10.1109/FPL.2016.7577342}, interhash = {ffb566e0ff182da471f40b6b2a5324a8}, intrahash = {a86f2927086bc9a832f3a38bc1ba6838}, isbn = {978-2-8399-1844-2}, keywords = {dblp}, pages = {1-11}, publisher = {IEEE}, timestamp = {2020-01-18T11:40:22.000+0100}, title = {Measure twice and cut once: Robust dynamic voltage scaling for FPGAs.}, url = {http://dblp.uni-trier.de/db/conf/fpl/fpl2016.html#AhmedZTB16}, year = 2016 }