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  3. Hongxia Fang

Hongxia Fang

Design-for-Testability and Diagnosis Methods to target unmodeled Defects in Integrated Circuits and Multi-Chip Boards.
. Duke University, Durham, NC, USA, (2011)base-search.net (ftdukeunivdsp:oai:dukespace.lib.duke.edu:10161/3910).
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