%0 Journal Article %1 journals/integration/TanAKSCH18 %A Tan, Sheldon X.-D. %A Amrouch, Hussam %A Kim, Taeyoung %A Sun, Zeyu %A Cook, Chase %A Henkel, Jörg %D 2018 %J Integr. %K %P 132-152 %T Recent advances in EM and BTI induced reliability modeling, analysis and optimization (invited). %U http://dblp.uni-trier.de/db/journals/integration/integration60.html#TanAKSCH18 %V 60

@article{journals/integration/TanAKSCH18, added-at = {2023-12-12T17:47:17.000+0100}, author = {Tan, Sheldon X.-D. and Amrouch, Hussam and Kim, Taeyoung and Sun, Zeyu and Cook, Chase and Henkel, Jörg}, biburl = {https://www.bibsonomy.org/bibtex/2bf17fb849fcadfa558944d242b90f374/admin}, ee = {https://doi.org/10.1016/j.vlsi.2017.08.009}, interhash = {08bf37df2ac2ad10d057bc497fd0361e}, intrahash = {bf17fb849fcadfa558944d242b90f374}, journal = {Integr.}, keywords = {}, pages = {132-152}, timestamp = {2023-12-12T17:47:17.000+0100}, title = {Recent advances in EM and BTI induced reliability modeling, analysis and optimization (invited).}, url = {http://dblp.uni-trier.de/db/journals/integration/integration60.html#TanAKSCH18}, volume = 60, year = 2018 }