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%0 Conference Paper
%1 conf/itc/ZarrinehAEG00
%A Zarrineh, Kamran
%A Adams, R. Dean
%A Eckenrode, Thomas J.
%A Gregor, Steven P.
%B ITC
%D 2000
%I IEEE Computer Society
%K dblp
%P 547-556
%T Self test architecture for testing complex memory structures.
%U http://dblp.uni-trier.de/db/conf/itc/itc2000.html#ZarrinehAEG00
%@ 0-7803-6546-1
@inproceedings{conf/itc/ZarrinehAEG00,
added-at = {2023-03-23T00:00:00.000+0100},
author = {Zarrineh, Kamran and Adams, R. Dean and Eckenrode, Thomas J. and Gregor, Steven P.},
biburl = {https://www.bibsonomy.org/bibtex/2caf0fd5da9ca7aadfb66b13a6e1824bc/dblp},
booktitle = {ITC},
crossref = {conf/itc/2000},
ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2000.894248},
interhash = {008f0cb2cc07b9318753f7ea9d8ff323},
intrahash = {caf0fd5da9ca7aadfb66b13a6e1824bc},
isbn = {0-7803-6546-1},
keywords = {dblp},
pages = {547-556},
publisher = {IEEE Computer Society},
timestamp = {2024-04-10T04:28:46.000+0200},
title = {Self test architecture for testing complex memory structures.},
url = {http://dblp.uni-trier.de/db/conf/itc/itc2000.html#ZarrinehAEG00},
year = 2000
}