%0 Conference Paper %1 conf/itc/ZarrinehAEG00 %A Zarrineh, Kamran %A Adams, R. Dean %A Eckenrode, Thomas J. %A Gregor, Steven P. %B ITC %D 2000 %I IEEE Computer Society %K dblp %P 547-556 %T Self test architecture for testing complex memory structures. %U http://dblp.uni-trier.de/db/conf/itc/itc2000.html#ZarrinehAEG00 %@ 0-7803-6546-1

@inproceedings{conf/itc/ZarrinehAEG00, added-at = {2023-03-23T00:00:00.000+0100}, author = {Zarrineh, Kamran and Adams, R. Dean and Eckenrode, Thomas J. and Gregor, Steven P.}, biburl = {https://www.bibsonomy.org/bibtex/2caf0fd5da9ca7aadfb66b13a6e1824bc/dblp}, booktitle = {ITC}, crossref = {conf/itc/2000}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2000.894248}, interhash = {008f0cb2cc07b9318753f7ea9d8ff323}, intrahash = {caf0fd5da9ca7aadfb66b13a6e1824bc}, isbn = {0-7803-6546-1}, keywords = {dblp}, pages = {547-556}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:28:46.000+0200}, title = {Self test architecture for testing complex memory structures.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2000.html#ZarrinehAEG00}, year = 2000 }